ליאור רוקח

אקדמי בכיר

Automatic discovery of the root causes for quality drift in high dimensionality manufacturing processes

Lior Rokach, Dan Hutter

A new technique for finding the root cause for problems in a manufacturing process is presented. The new technique is designated to continuously and automatically detect quality drifts on various manufacturing processes and then induce the common root cause. The proposed technique consists of a fast, incremental algorithm that can process extremely high dimensional data and handle more than one root-cause at the same time. Application of such a methodology consists of an on-linemachine learning system that investigates and monitors the behavior of manufacturing product routes.

שפת פרסום אנגלית
דפים 1915-1930
כתב עת Journal of Intelligent Manufacturing
כרך 23
נושא מספר 5
סטטוס פרסום פורסם - 01.10.2012

Keywords

Automatic root cause discovery
Concept drift
Data mining
Failure analysis
Fault detection
Quality control
Yield improvement

ASJC Scopus subject areas

Software
Industrial and Manufacturing Engineering
Artificial Intelligence

Sustainable Development Goals

SDG 9 - Industry, Innovation, and Infrastructure
גישה למסמך
10.1007/s10845-011-0517-5
קבצים וקישורים אחרים
Link to publication in Scopus