מרק לסט

אקדמי בכיר

Collection of test case sequences

Covering of function cluster digraph

Mark Sh Levin, Mark Last

The paper focuses on multi-function system testing in the case of multi-stage testing process. In this paper we deal with the problem of covering a digraph of system function clusters by chains (trails) of test cases. The problem is solved by the combinatorial algorithms which include special case algorithms (e.g., tree-like digraph); approximation-based, partitioning-based, and greedy algorithms; and an algorithm based on the maximal matching. Numerical examples illustrate our approach.

שפת פרסום אנגלית
דפים 806-810
סטטוס פרסום פורסם - 01.12.2004
מספר מאמר 411-083

Keywords

Chain covering of digraph
Combinatorial algorithms
Combinatorial optimization
Functional testing
Input-output analysis
System testing
Test case sequence

ASJC Scopus subject areas

General Engineering
קבצים וקישורים אחרים
Link to publication in Scopus