
מרק לסט
אקדמי בכיר
Collection of test case sequences
Covering of function cluster digraph
The paper focuses on multi-function system testing in the case of multi-stage testing process. In this paper we deal with the problem of covering a digraph of system function clusters by chains (trails) of test cases. The problem is solved by the combinatorial algorithms which include special case algorithms (e.g., tree-like digraph); approximation-based, partitioning-based, and greedy algorithms; and an algorithm based on the maximal matching. Numerical examples illustrate our approach.
| שפת פרסום | אנגלית |
| דפים | 806-810 |
| סטטוס פרסום | פורסם - 01.12.2004 |
| מספר מאמר | 411-083 |
Keywords
Chain covering of digraph
Combinatorial algorithms
Combinatorial optimization
Functional testing
Input-output analysis
System testing
Test case sequence
ASJC Scopus subject areas
General Engineering