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אקדמי בכיר

Automata Models for Effective Bug Pattern Description

Tom Yaacov, Gera Weiss, Gal Amram, Avi Hayoun

Debugging complex systems is a crucial yet time-consuming task. This paper presents the use of automata learning and testing techniques to obtain concise and informative bug descriptions. We introduce the concepts of Failure Explanations (FE), Eventual Failure Explanations (EFE), and Early Detection (ED) to provide meaningful summaries of failing behavior patterns. By factoring out irrelevant information and focusing on essential test patterns, our approach aims to enhance bug detection and understanding. We evaluate our methods using various test patterns and real-world benchmarks, demonstrating their effectiveness in producing compact and informative bug descriptions.

שפת פרסום אנגלית
דפים 119-129
סטטוס פרסום פורסם - 01.01.2025

Keywords

automata learning
failure description
formal methods
model-based debugging
model-based testing

ASJC Scopus subject areas

Modeling and Simulation
קבצים וקישורים אחרים
Link to publication in Scopus