ארמין שמילוביץ

אקדמי בכיר

On the use of decision tree induction for discovery of interactions in a photolithographic process

This paper delineates a comprehensive and successful application of decision tree induction to 1054 records of production lots taken from a lithographic process with 45 processing steps. Complex interaction effects among manufacturing equipment that lead to increased product variability have been detected. The extracted information has been confirmed by the process engineers, and used to improve the lithographic process. The paper suggests that decision tree induction may be particularly useful when data is multidimensional, and the various process parameters and machinery exhibit highly complex interactions. Another implication is that on-line monitoring of the manufacturing process (e.g., closed-loop critical dimensions control) using data mining may be highly effective.

שפת פרסום אנגלית
דפים 644-652
כתב עת IEEE Transactions on Semiconductor Manufacturing
כרך 16
נושא מספר 4
סטטוס פרסום פורסם - 01.11.2003

Keywords

Data mining
Decision tree induction
Photolithography
Semiconductor process control
Yield management

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Sustainable Development Goals

SDG 9 - Industry, Innovation, and Infrastructure
גישה למסמך
10.1109/TSM.2003.818959
קבצים וקישורים אחרים
Link to publication in Scopus