Critical point drying is an efficient method for drying delicate samples for SEM applications. It preserves the surface structure of a specimen which could otherwise be damaged when drying.
Location: Building No. 51, Room No. 005
- Our Vision
- Infrastructure Units
- Bio-imaging and Flow Cytometry
- Bioinformatics Core Facility
- Structural Biology
- Electron Microscopy
- Analytical High Resolution TEM - JEOL JEM 2100F
- Bench-top SEM - Phenom
- Critical Point Dryer (CPD) - Tousimis 931
- Cryo EM-GLACIOS
- Cryo TEM-Talos F200C
- Cryo TEM-Tecnai T12 G2 TWIN
- Dual Beam FIB - Helios G4 UC
- EM VCT 500, Leica
- Freeze fracture ACE 900, Leica
- High pressure freezing EM ICE, Leica
- HRSEM - Verios 460L
- HRSEM (including cryo) - Gemini 300, Zeiss
- Plunger - Leica EM GP 2
- S/TEM Spectra 200
- Sputter coater: Emitech K575X
- Sputter coater: Quorum Q150T ES
- Elemental Analysis
- Genomic Analysis
- Mass Spectrometry, Chromatography
- Scattering and X-Ray Analysis
- Spectroscopy
- Surface Analysis
- Thermal and Mechanical Analysis
The Ilse Katz Institute for Nanoscale Science & Technology
