Nanomaterials @ Interfaces Research Group

We describe an image processing technique which allows the assessment of the extent of short range order in partially ordered thin films from their high resolution images. The approach is illustrated using the example of apparently amorphous CdSe quantum dots on a Pd substrate. We have been able to show that the particles contain a high degree of short range order, and maintain an epitaxial alignment with the Pd substrate. We also demonstrate the wider applications of this method, taking as an example the characterisation of surface layers on FeSbO4.