Alberto Bilenca

Senior Academic

Differential near-field scanning optical microscopy using sensor arrays

Aydogan Ozcan, Ertugrul Cubukcu, Alberto Bilenca, Brett E. Bouma, Federico Capasso, Guillermo J. Tearney

In this paper, we introduce a new aperture-type near-field scanning optical microscopy (NSOM) imaging concept that relies on specially designed large-area (e.g., $200$ nm $,\×,$200 nm) aperture geometries having sharp corners. Unlike in conventional NSOM, the spatial resolution of this near-field imaging modality is not determined by the size of the aperture, but rather by the sharpness of the corners of the large aperture. This approach significantly improves the light throughput of the near-field probe and, hence, increases the SNR. Here, we discuss the basic concepts of this near-field microscopy approach and illustrate both theoretically and experimentally how an array of detectors can be utilized to further improve the SNR of the near-field image. The results of this work are particularly relevant for imaging of biological samples at a spatial resolution of $ 50$ nm with significantly improved image quality.

Publication language English
Pages 1721-1729
Journal IEEE Journal of Selected Topics in Quantum Electronics
Volume 13
Issue number 6
Publication status Published - 01.11.2007

Keywords

Differential NSOM (DNSOM)
Near-field imaging
Near-field scanning optical microscopy (NSOM)
SNOM

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering
Access to Document
10.1109/JSTQE.2007.910799
Other files and links
Link to publication in Scopus