Alberto Bilenca

Senior Academic

Depth-resolved nanoscopic single particle tracking based on fluorescence phase-shifting interferometry

Elad Arbel, Alberto Bilenca

We propose and analyze the use of fluorescence phase-shifting interferometric (PSI) imaging for single particle tracking along 1 μm-depth (z) trajectories. While spatial PSI using a single camera attains a maximal twofold improvement in the z-localization precision compared to temporal PSI for <0.1 μm2/s diffusion, temporal PSI shows a fourfold larger field-of-view.

Publication language English
Publication status Published - 01.01.2013
6833637

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials