Yossi

Yossi Oren

Senior Academic

Remanence Decay Side-Channel

The PUF Case

Shaza Zeitouni, Yossef Oren, Christian Wachsmann, Patrick Koeberl, Ahmad Reza Sadeghi

We present a side-channel attack based on remanence decay in volatile memory and show how it can be exploited effectively to launch a noninvasive cloning attack against SRAM physically unclonable functions (PUFs)-an important class of PUFs typically proposed as lightweight security primitives, which use existing memory on the underlying device. We validate our approach using SRAM PUFs instantiated on two 65-nm CMOS devices. We discuss countermeasures against our attack and propose the constructive use of remanence decay to improve the cloning resistance of SRAM PUFs. Moreover, as a further contribution of independent interest, we show how to use our evaluation results to significantly improve the performance of the recently proposed TARDIS scheme, which is based on remanence decay in SRAM memory and used as a time-keeping mechanism for low-power clockless devices.

Publication language English
Pages 1106-1116
Journal IEEE Transactions on Information Forensics and Security
Volume 11
Issue number 6
Publication status Published - 01.06.2016
7366576

Keywords

SRAM PUF
data remanence decay
fault injection attack
side-channel analysis

ASJC Scopus subject areas

Safety, Risk, Reliability and Quality
Computer Networks and Communications
Access to Document
10.1109/TIFS.2015.2512534
Other files and links
Link to publication in Scopus