Mark Last

Senior Academic

Collection of test case sequences

Covering of function cluster digraph

Mark Sh Levin, Mark Last

The paper focuses on multi-function system testing in the case of multi-stage testing process. In this paper we deal with the problem of covering a digraph of system function clusters by chains (trails) of test cases. The problem is solved by the combinatorial algorithms which include special case algorithms (e.g., tree-like digraph); approximation-based, partitioning-based, and greedy algorithms; and an algorithm based on the maximal matching. Numerical examples illustrate our approach.

Publication language English
Pages 806-810
Publication status Published - 01.12.2004
Article Number 411-083

Keywords

Chain covering of digraph
Combinatorial algorithms
Combinatorial optimization
Functional testing
Input-output analysis
System testing
Test case sequence

ASJC Scopus subject areas

General Engineering
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Link to publication in Scopus