ELECTRO-OPTICS  LABORATORY

Department of Electrical and Computer Engineering

Field-of-view extended quantitative phase microscope by coded aperture correlation holography

Nathaniel Hai, Joseph Rosen

A quantitative phase microscope with improved accuracy and extended field-of-view (FOV) is demonstrated based on coded aperture correlation holography. By using a certain type of coded phase masks, we increased the phase measurement certainty up to a factor of 5 compared to a conventional, open-aperture interferometric approach. Moreover, a threefold FOV extension is shown based on the same type of coded phase masks, independently of the area ratio between the used phase mask display and the image recording devices. Integration of the two powerful imaging capabilities in a single camera exposure turns the suggested approach to an attractive phase imager.

Publication language English
Publication status Published - 01.01.2021
1165308

Keywords

Coded aperture correlation holography
Extended field-of-view
Interferometry
Label-free phase imaging
Quantitative phase microscopy

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Biomaterials
Radiology Nuclear Medicine and imaging
Access to Document
10.1117/12.2576611
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Link to publication in Scopus