ELECTRO-OPTICS LABORATORY
Department of Electrical and Computer Engineering
Depth estimation and optical sectioning by parallax analysis
We present a blind method of optical sectioning for general three-dimensional imaging. A parallax analysis on multiple view projections of a white light illuminated three-dimensional scene yields undistorted slices along the optical axis.
| Publication language | English |
| Publication status | Published - 01.01.2009 |
ASJC Scopus subject areas
Instrumentation
Atomic and Molecular Physics, and Optics
