ELECTRO-OPTICS LABORATORY
Department of Electrical and Computer Engineering
Noninvasive imaging through a thin scattering layer using coded phase masks
A noninvasive imaging technique to see through scattering layers using spatial light modulator (SLM) has been demonstrated. A phase retrieval algorithm is used to process the object information from the recorded intensity patterns. OCIS codes: (170.1630) Coded aperture imaging; (100.5070) Phase retrieval; (110.0113) Imaging through turbid.
| Publication language | English |
| Publication status | Published - 13.05.2019 |
ASJC Scopus subject areas
Electronic, Optical and Magnetic Materials
Mechanics of Materials
