ELECTRO-OPTICS  LABORATORY

Department of Electrical and Computer Engineering

Scanning holographic microscopy with resolution exceeding the Rayleigh limit of the objective by superposition of off-axis holograms

Guy Indebetouw, Yoshitaka Tada, Joseph Rosen, Gary Brooker

We present what we believe to be a new application of scanning holographic microscopy to superresolution. Spatial resolution exceeding the Rayleigh limit of the objective is obtained by digital coherent addition of the reconstructions of several off-axis Fresnel holograms. Superresolution by holographic superposition and synthetic aperture has a long history, which is briefly reviewed. The method is demonstrated experimentally by combining three off-axis holograms of fluorescent beads showing a transverse resolution gain of nearly a factor of 2.

Publication language English
Pages 993-1000
Journal Applied Optics
Volume 46
Issue number 6
Publication status Published - 20.02.2007

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Engineering (miscellaneous)
Electrical and Electronic Engineering
Access to Document
10.1364/AO.46.000993
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Link to publication in Scopus