ELECTRO-OPTICS LABORATORY
Department of Electrical and Computer Engineering
Noninvasive imaging through a thin scattering layer using coded phase masks
A noninvasive imaging technique to see through scattering layers using spatial light modulator (SLM) has been demonstrated. A phase retrieval algorithm is used to process the object information from the recorded intensity patterns.
| Publication language | English |
| Publication status | Published - 13.05.2019 |
| DH-2019-M5B.2 |
ASJC Scopus subject areas
Computer Graphics and Computer-Aided Design
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
