בית הספר
להנדסת חשמל ומחשבים

Abstract: Textbook quantum mechanics treats measurement as a mathematical projection. In reality, measurement is a dynamical physical process subject to both fundamental constraints (such as back-action and added noise) and technical bottlenecks (such as insertion loss and circuit complexity). The interface where this process occurs--the boundary between the fragile quantum system and the robust macroscopic world--currently limits the scalability and fidelity of almost all quantum technologies. In this talk, I present a framework for in-situ quantum signal processing in superconducting circuits. I will demonstrate how we can address the interface challenge by replacing static hardware--isolators, amplifiers, and splitters--with engineered time-dependent interactions implemented directly on-chip. By parametrically driving multi-wave mixing processes, we engineer effective Hamiltonians that break reciprocity and amplify signals at the source. This architecture eliminates the need for bulky magnetic isolation, offering a scalable path toward high-fidelity, directional readout in large-scale arrays. Second, I will address the fundamental physics of analyzing these driven systems. Finite measurement bandwidth implies that our observation is inherently incomplete; we effectively "coarse-grain" over the system's fastest dynamics. To model this, I introduce a method that derives effective generators for these time-averaged observables. I will show how it allows us to capture the non-trivial effects of competing timescales in strongly driven systems, revealing deterministic corrections that are essential for understanding the limits and prospects of driven systems. Short bio: Leon Bello received his PhD in Physics from Bar-Ilan University in 2021 under the supervision of Prof. Avi Pe’er, with a focus on parametric processes for sensing and computation. He subsequently held a postdoctoral position at Princeton University with Prof. Hakan Türeci, where he worked on quantum device theory, quantum control, and computation in engineered physical systems. He is currently a postdoctoral fellow at the Weizmann Institute of Science.

RICCARDO MANDRIOLI (Senior Member, IEEE) received the Ph.D. degree (Hons.) in Biomedical, Electrical, and System Engineering in Mar. 2023, from the University of Bologna, Bologna, Italy. Currently, he is a Tenure Track Assistant Professor (RTT) in Electrical Engineering, with the Department of Electrical, Electronic, and Information Engineering, University of Bologna. From Nov. 2022 to Jan. 2024, he has been a Postdoctoral Research Fellow and Adjunct Professor, and he has also been involved as a Teaching Assistant for multiple engineering courses since 2017. In 2022, he was a Visiting Scientist with the Chair of Power Electronics, Kiel University, Kiel, Germany. In Nov. 2023, he received the National Scientific Habilitation (ASN) for the permanent position of Associate Professor in Electrical Engineering. His research interests include electric vehicle chargers, photovoltaic, power electronic converters, harmonic pollution, efficiency improvement, and circuit modeling. Dr. Mandrioli was the winner of several awards with IEEE. He is an Associate Editor for the IEEE Access, an Editorial Board Member of several journals, entrepreneurship committee member of the IEEE Italy Section, and Treasurer of the IEEE IES Italian Chapter. Reliability Implications of Modulation Techniques in Modular Dual Active Bridge EV Chargers Modular Dual Active Bridge (DAB) converters are increasingly adopted in high-power electric vehicle (EV) charging systems due to their scalability, galvanic isolation, and bidirectional power flow capability. Beyond efficiency and power density, long-term reliability has become a key design driver, especially in modular architectures where thermal and electrical stresses are strongly influenced by control and modulation choices. This talk first recalls the operating principles of the DAB converter, with particular emphasis on power transfer mechanisms and current waveforms under phase-shift modulation. Subsequently, the fundamentals of lifetime estimation for power electronic components are introduced, focusing on semiconductor devices and passive components, and highlighting the link between modulation-dependent stress profiles, thermal cycling, and wear-out mechanisms. The core of the presentation assesses the reliability implications of different modulation strategies—Single Phase Shift (SPS), Dual Phase Shift (DPS), and Extended Phase Shift (EPS)—in a modular DAB-based EV charger. In addition, higher-level operational strategies such as phase shedding and module rotation are analyzed as effective tools to redistribute losses, reduce temperature swings, and mitigate uneven aging among modules. A detailed case study of a modular EV charger is used to quantify lifetime variations under realistic operating conditions, enabling a comparative discussion of the trade-offs between efficiency and reliability.