High Temperature X Ray Diffraction (HT XRD)

HT‑XRD provides in‑situ structural analysis of materials as they undergo heating, enabling real‑time observation of phase transitions, lattice parameter evolution, crystallization behavior, and high‑temperature reactions. This technique is indispensable for studying synthesis mechanisms, thermal stability, oxidation behavior, and structure–property relationships. HT‑XRD data support development of functional materials, refractories, catalysts, and alloys by revealing how structural changes influence performance under operational conditions.